DocumentCode :
1358980
Title :
Contingency screening for steady-state security analysis by using FFT and artificial neural networks
Author :
Sidhu, Tarlochan S. ; Cui, Lan
Author_Institution :
Power Syst. Res. Group, Saskatchewan Univ., Saskatoon, Sask., Canada
Volume :
15
Issue :
1
fYear :
2000
fDate :
2/1/2000 12:00:00 AM
Firstpage :
421
Lastpage :
426
Abstract :
A new approach based on artificial neural networks (ANNs) combined with fast Fourier transform (FFT) is developed for single line contingency screening in steady-state security analysis. The offline fast decoupled load flow calculations are adopted to construct two kinds of performance indices, PIp (active power performance index) and PIv (reactive power performance index) which reflect the severity degree of contingencies. The results from offline calculations of the load flow are used to train a multilayered artificial neural network for estimating the performance indices. FFT is used for preprocessing the inputs to improve and speed up the ANN training. The effectiveness of the proposed method is demonstrated by contingency ranking on two IEEE test systems and comparisons are made with the traditional method. Good calculation accuracy, high contingency capturing rate and faster analysis times for contingency screening are obtained by using the ANNs
Keywords :
fast Fourier transforms; load flow; multilayer perceptrons; power system analysis computing; power system security; FFT; active power performance index; computer simulation; contingency ranking; contingency screening; fast Fourier transform; multilayered artificial neural networks; offline fast decoupled load flow calculations; power systems; reactive power performance index; single line contingency screening; steady-state security analysis; Accuracy; Artificial neural networks; Data preprocessing; Fast Fourier transforms; Load flow; Performance analysis; Reactive power; Security; Steady-state; System testing;
fLanguage :
English
Journal_Title :
Power Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8950
Type :
jour
DOI :
10.1109/59.852154
Filename :
852154
Link To Document :
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