DocumentCode
1359622
Title
Towards Process Variation-Aware Power Gating
Author
Yeh, Chingwei ; Chen, Yuan-Chang ; Wang, Jinn-Shyan
Author_Institution
Electr. Eng. Dept., Nat. Chung-Cheng Univ., Taichung, Taiwan
Volume
20
Issue
11
fYear
2012
Firstpage
1929
Lastpage
1937
Abstract
This paper presents a power gating design that considers process variation for proper wakeup control. First, the surge current constraint is examined and refined for a simpler and more realistic view of inter-module reliability. Following that, several circuits are proposed on top of a delay chain to adapt the timing control of power switches to process variations. Experimental results show that the proposed design is able to track process variation such that the surge current and the wakeup time are both kept to expectation in all process corners.
Keywords
power MOSFET; semiconductor device reliability; switches; inter-module reliability; power gating design; power switches; process variation-aware power gating; surge current constraint; timing control; wakeup control; Control systems; Delay; Detectors; Process control; Reliability; Surges; Power gating; power management; process corner; surge current; wakeup;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2011.2169435
Filename
6059463
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