Abstract :
This 20-page bulletin gives a detailed description of piezoresistance in semiconductors, strain-gage characteristics, and typical strain-gage measurement circuits. Definitions of piezoresistivity, gage factor, and doping start the presentation, followed by a discussion of gage characteristics. The circuitry section details bridge circuits, dynamic strain measurements, static strain measurements, gage factor compensation and maximum excitation voltage. Strain-gage installation is also detailed regarding surface preparation, cements, bonding bare gages, and bonding encapsulated gages
