DocumentCode :
1360206
Title :
Solid state: X-ray lithography breaks the submicrometer barrier; A new X-ray lithography system allowed Bell Labs engineers to make the smallest, fastest MOSFETs yet reported
Author :
Lepselter, M.P.
Author_Institution :
Bell Labs., Holmdel, NJ, USA
Volume :
18
Issue :
5
fYear :
1981
fDate :
5/1/1981 12:00:00 AM
Firstpage :
26
Lastpage :
29
Abstract :
Describes an X-ray lithography system which allowed Bell Labs. engineers to make MOSFETs with channel lengths of 0.3 to 0.4 micrometers, switching speeds of 30 to 75 picoseconds, and speed-power products of 5 femtojoules (5×10-15 Ws) to 50 femtojoules. The X-ray system is smaller, less expensive, and more reliable than previous X-ray systems, and it also has a higher throughput-potentially 75 wafers per hour. It uses an exposure power of 4.5 kW, compared to the 20 to 40 kW in other systems. The key to a short exposure time with a low power source is the use of a novel resist that is more radiation-sensitive than conventional resists. Another advantage of the system is exceptional linewidth control-better than 0.1 micrometer across the wafer.
Keywords :
X-ray applications; field effect integrated circuits; integrated circuit technology; photolithography; photoresists; 0.3 to 0.4 micrometers; MOSFET; X-ray lithography system; field effect integrated circuit; linewidth control; Gallium arsenide; Laboratories; Logic gates; Plasmas; Polymers; Resists; Silicon;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1981.6369505
Filename :
6369505
Link To Document :
بازگشت