DocumentCode :
1360673
Title :
Built-in self-test for designers
Volume :
14
Issue :
3
fYear :
1997
Firstpage :
113
Lastpage :
121
Keywords :
Automatic testing; Built-in self-test; Central Processing Unit; Circuit testing; Design automation; Energy management; Manufacturing processes; Microprocessors; Pins; System testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1997.606009
Filename :
606009
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1360673
