Title :
Effect of V-Shaped Pit Size on the Reverse Leakage Current of InGaN/GaN Light-Emitting Diodes
Author :
Jaekyun Kim ; Joosung Kim ; Youngjo Tak ; Suhee Chae ; Jun-Youn Kim ; Youngsoo Park
Author_Institution :
Samsung Adv. Inst. of Technol., Samsung Electron. Co., Yongin, South Korea
Abstract :
We report the effect of V-shaped pit size, inverted hexagonal pits embedded in InGaN multiple quantum well, on the reverse leakage current of InGaN light-emitting diodes (LEDs). It was found that the reverse leakage current of InGaN LEDs with larger V-shaped pits is significantly reduced from 1.80 mA down to 3.84 nA at -30 V by several orders of magnitude. We claim that this improvement is accounted for increased Poole-Frenkel barrier height of carrier trapped at the deep centers via enlarged V-pit formation, consequently resulting in lower reverse current of InGaN LEDs.
Keywords :
III-V semiconductors; Poole-Frenkel effect; gallium compounds; indium compounds; leakage currents; light emitting diodes; semiconductor quantum wells; wide band gap semiconductors; InGaN-GaN; LED; Poole-Frenkel barrier height; V-shaped pit size; current 1.80 mA to 3.84 nA; deep centers; inverted hexagonal pits; light-emitting diodes; multiple quantum well; reverse leakage current; voltage -30 V; Current measurement; Gallium nitride; Leakage currents; Light emitting diodes; Quantum well devices; Scanning electron microscopy; Tunneling; GaN; V-shaped pit; leakage current; light-emitting diodes (LEDs);
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2013.2280017