Title :
Frequency Synthesizer Failure Heuristics
Author :
Spiegel, Jeff N.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Utah, Salt Lake City, UT, USA
Abstract :
A sufficient set of criteria is presented for the verification of frequency synthesizers. Failure modes are identified for automatic gain control (AGC), phase-locked loop (PLL), and voltage-controlled oscillator (VCO) circuits. Low- and high-frequency noise, thermal, and vibration effects are presented for VCOs and PLLs.
Keywords :
automatic gain control; automatic test equipment; failure analysis; frequency synthesizers; phase locked loops; reliability; voltage-controlled oscillators; AGC; PLL; automatic gain control; automatic test equipment; frequency synthesizer failure heuristics; phase-locked loop; vibration effect; voltage-controlled oscillator; Automatic test equipment; automatic testing; interference suppression; low-frequency noise; phase noise; phase-locked loops (PLLs); radio-frequency (RF) measurements; temperature measurement; vibrations (VIBs);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2009.2025465
