• DocumentCode
    1360861
  • Title

    Frequency Synthesizer Failure Heuristics

  • Author

    Spiegel, Jeff N.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Utah, Salt Lake City, UT, USA
  • Volume
    58
  • Issue
    10
  • fYear
    2009
  • Firstpage
    3365
  • Lastpage
    3372
  • Abstract
    A sufficient set of criteria is presented for the verification of frequency synthesizers. Failure modes are identified for automatic gain control (AGC), phase-locked loop (PLL), and voltage-controlled oscillator (VCO) circuits. Low- and high-frequency noise, thermal, and vibration effects are presented for VCOs and PLLs.
  • Keywords
    automatic gain control; automatic test equipment; failure analysis; frequency synthesizers; phase locked loops; reliability; voltage-controlled oscillators; AGC; PLL; automatic gain control; automatic test equipment; frequency synthesizer failure heuristics; phase-locked loop; vibration effect; voltage-controlled oscillator; Automatic test equipment; automatic testing; interference suppression; low-frequency noise; phase noise; phase-locked loops (PLLs); radio-frequency (RF) measurements; temperature measurement; vibrations (VIBs);
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2025465
  • Filename
    5229173
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1360861