Title : 
Solar cells doping by beam line and plasma immersion ion implantation
         
        
            Author : 
Coig, M. ; Milesi, F. ; Payen, N. ; Reboh, S. ; Mazen, F. ; Lanterne, A. ; Le Perchec, J. ; Gall, S. ; Veschetti, Y.
         
        
            Author_Institution : 
LETI, CEA, Grenoble, France
         
        
        
            fDate : 
June 26 2014-July 4 2014
         
        
        
        
            Abstract : 
The doping of n-type silicon solar cells was investigated using two ion implantation techniques: beam line and plasma immersion. Initially we studied the effects of beam line ion implantation, where the dopants were activated by two different annealing routines. The first one used a single annealing to activate both B implanted emitter and P implanted back surface field (BSF), while the second one used two different annealing to separately activate the dopants. Good yield was reached with a record cell of 20.33% efficiency. Secondly, we investigated the doping by plasma immersion ion implantation with final objective of fabricate a solar cell fully doped by plasma.
         
        
            Keywords : 
annealing; elemental semiconductors; plasma immersion ion implantation; semiconductor doping; silicon; solar cells; B implanted emitter; BSF; P implanted back surface field; Si; annealing routine; beam line effect; dopant; efficiency 20.33 percent; ion implantation technique; n-type silicon solar cell doping; plasma immersion; Annealing; Doping; Ion implantation; Photovoltaic cells; Plasmas; Resistance; Silicon; beam line ion implantation; doping; plasma immersion ion implantation; silicon solar cells;
         
        
        
        
            Conference_Titel : 
Ion Implantation Technology (IIT), 2014 20th International Conference on
         
        
            Conference_Location : 
Portland, OR
         
        
        
            DOI : 
10.1109/IIT.2014.6939976