DocumentCode
1361300
Title
n-Type Nanocrystalline-
/p-Type Si Heterojunction Photodiodes Prepared at Room Temperature
Author
Shaban, Mahmoud ; Kawai, Kenji ; Promros, Nathaporn ; Yoshitake, Tsuyoshi
Author_Institution
Dept. of Electr. Eng., South Valley Univ., Aswan, Egypt
Volume
31
Issue
12
fYear
2010
Firstpage
1428
Lastpage
1430
Abstract
n-Type nanocrystalline-FeSi2/p-type Si heterojunctions were prepared at room temperature by means of a facing target direct-current sputtering method. The current density-voltage (J- V) characteristics of the devices fabricated were investigated in the temperature range of 77-300 K. At a wavelength of 1.31 μm, the photodiodes exhibited a room-temperature responsivity of 110 mA/cm2 and a detectivity of 2.7 × 108 cm√Hz/W, which was improved to 1.5 ×1010 cm√Hz/W at 77 K. The results profile an attractive low-cost near-infrared photodiode suitable for large-area optoelectronics.
Keywords
elemental semiconductors; infrared sources; iron compounds; nanofabrication; nanostructured materials; optical fabrication; p-n heterojunctions; photodiodes; semiconductor growth; silicon; sputter deposition; FeSi2-Si; Si; current density-voltage characteristics; direct-current sputtering method; iron disilicide semiconducting material; large-area optoelectronics; n-type nanocrystalline heterojunction infrared photodiodes; optical fabrication; temperature 77 K to 300 K; wavelength 1.31 mum; Crystals; Current measurement; Heterojunctions; Nanostructured materials; Photodiodes; Temperature distribution; Temperature measurement; Heterojunctions; iron disilicide; photodiodes;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2010.2078793
Filename
5610704
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