Title :
A Scalable SCR Compact Model for ESD Circuit Simulation
Author :
Di Sarro, James P. ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
A scalable compact model for SCR-based electrostatic discharge (ESD) protection devices is presented. This model captures the effect that layout spacing has on SCR characteristics, such as holding voltage and trigger current. The model also captures both the delayed turn-on of the SCR, which results in large voltage overshoots during fast rise-time ESD events and the charge removal mechanisms that underlie the turn-off transient. Bias and time dependences of SCR on-resistance are captured with a resistance model that accounts for self-heating.
Keywords :
circuit layout; circuit simulation; electrostatic discharge; heating; semiconductor device models; thyristors; ESD circuit simulation; SCR on-resistance; charge removal mechanisms; electrostatic discharge protection; holding voltage; layout spacing; scalable SCR compact model; self-heating; trigger current; turn-off transient; Electrostatic discharge; Integrated circuit modeling; Mathematical model; P-i-n diodes; Scalability; Thyristors; Compact modeling; electrostatic discharge (ESD); silicon-controlled rectifier (SCR);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2010.2081674
