• DocumentCode
    1361473
  • Title

    A dynamic-threshold SOI device with a J-FET embedded source structure and a merged body-bias-control transistor. II. Circuit simulation

  • Author

    Horiuchi, Masatada

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    47
  • Issue
    8
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    1593
  • Lastpage
    1598
  • Abstract
    For pt.I see ibid., vol. 47, no.8, p.1587-92 (2000). A primary transistor having an embedded J-FET, or resistor, immediately under the source junction and a small subsidiary body-bias-control transistor enables the construction of a variable-threshold SOI MOSFET with a small area penalty and without any limitation on the power-supply voltage. The subsidiary transistor, synchronized with the gate input signal, injects charges into the body depending on the output-node transient condition and controls the body potential to increase the on-current and decrease the off-current. The embedded J-FET eliminates such floating-body effects as delay hysteresis. The inverter delay time with a 1-pF load capacitance can be shortened to 40% of that of a bulk device under I-V operation, A different embedded J-FET circuit construction under the source enables an NMOS pass gate to be constructed without the output-amplitude degradation caused by the source follower, with a switching speed higher than that of a conventional CMOS pass gate
  • Keywords
    CMOS integrated circuits; MOSFET; circuit simulation; delays; silicon-on-insulator; transient analysis; JFET embedded source structure; NMOS pass gate; Si; area penalty; dynamic-threshold SOI device; gate input signal; inverter delay time; load capacitance; merged body-bias-control transistor; off-current; on-current; output-amplitude degradation; output-node transient condition; power-supply voltage; source follower; switching speed; Capacitance; Degradation; Delay effects; Hysteresis; Inverters; MOS devices; MOSFET circuits; Power MOSFET; Resistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.853036
  • Filename
    853036