DocumentCode :
1361727
Title :
A Calibration-Free 800 MHz Fractional-N Digital PLL With Embedded TDC
Author :
Chen, Mike Shuo-Wei ; Su, David ; Mehta, Srenik
Author_Institution :
Atheros Commun., San Jose, CA, USA
Volume :
45
Issue :
12
fYear :
2010
Firstpage :
2819
Lastpage :
2827
Abstract :
A digital PLL (DPLL) with a time-to-digital converter (TDC) embedded within a digitally controlled oscillator (DCO) has been implemented in 65 nm CMOS occupying an active area of 0.027 mm . The quantization step of the TDC naturally tracks the DCO period over corners, and therefore requires no calibration. By utilizing an interpolation flip flop, the timing resolution provided by DCO is further enhanced. The DPLL achieves fractional-N operation without a multi-modulus feedback divider, thereby avoiding its complexity and quantization noise. To improve the TDC linearity, a mismatch filtering technique that incorporates cross-coupled resistor network is proposed to achieve a DNL less than 0.04 LSB of the TDC quantization level. The prototype consumes 3.2 mW with an operation frequency ranging from 600 to 800 MHz. The measured DPLL output phase noise at 800 MHz frequency (after a divide-by-two) achieves and dBc/Hz at 1 kHz and 1 MHz offset, respectively.
Keywords :
CMOS digital integrated circuits; digital phase locked loops; flip-flops; interpolation; CMOS; calibration-free fractional-N digital PLL; cross-coupled resistor network; digitally controlled oscillator; embedded time-to-digital converter; frequency 1 MHz; frequency 1 kHz; frequency 600 MHz to 800 MHz; interpolation flip flop; mismatch filtering technique; multimodulus feedback divider; power 3.2 mW; size 65 nm; timing resolution; Digital control; Digital-controlled oscillators; Interpolation; Noise; Phase locked loops; Quantization; ADPLL; calibration free; clock generation; digital PLL; embedded TDC; interpolation flip flop; mismatch filtering; phase locked loop; time to digital converter;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2010.2074950
Filename :
5610982
Link To Document :
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