Title :
Automatic test generation algorithms for analogue circuits
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
The author reviews the recently published automatic test generation algorithms for analogue circuits, focusing on their applicability to specific circuit classes, limitations in more general applications and possible improvements. Selected new test generation paradigms, involving design-for-test and BIST techniques, are also discussed to indicate future directions in test generation
Keywords :
analogue integrated circuits; automatic test software; built-in self test; design for testability; integrated circuit testing; ATPG algorithms; BIST techniques; DFT techniques; analogue circuits; automatic test generation algorithms; design-for-test techniques;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
DOI :
10.1049/ip-cds:19960898
