Title :
Near-UV Irradiation Effects on Pentacene-Based Organic Thin Film Transistors
Author :
Wrachien, Nicola ; Cester, Andrea ; Bari, Daniele ; Kovac, Jaroslav ; Jakabovic, Jan ; Donoval, Daniel ; Meneghesso, Gaudenzio
Author_Institution :
Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
Abstract :
We irradiated Organic Thin-Film Transistors using light sources with peak wavelength in the near-UV spectrum. Organic Thin-Film Transistors have been found very sensitive to near UV rays. Irradiation generates negative trapped charge due to photogeneration, as well as neutral defects, which degrade the mobility and transconductance. We observed noticeable degradation even with 400-nm wavelength, which lies between visible and UV-light. Stronger variations were observed with the shortest wavelength, with a transconductance drop of -85% after 33000-s irradiation with 310 nm UV. We found that the mobility degradation is permanent after storing the devices in vacuum at least for 50 days.
Keywords :
electric admittance; organic semiconductors; semiconductor device reliability; semiconductor thin films; thin film transistors; ultraviolet radiation effects; UV-light; light sources; mobility degradation; near UV rays; near-UV irradiation effects; near-UV spectrum; negative trapped charge; neutral defects; peak wavelength; pentacene-based organic thin film transistors; photogeneration; time 33000 s; transconductance drop; visible light; wavelength 310 nm; wavelength 400 nm; Charge carrier processes; Degradation; Organic thin film transistors; Pentacene; Radiation effects; Reliability; Organic electronic devices; reliability; thin-film-transistors; ultraviolet irradiation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2170432