Title :
Magnetic force microscopy studies of DC erasure in a 5 Gbit/in2 medium [CoCrPtTa/CrMo]
Author :
Abarra, E.N. ; Suzuki, T.
Author_Institution :
Inf. Storage Mater. Lab., Toyota Technol. Inst., Nagoya, Japan
fDate :
3/1/1998 12:00:00 AM
Abstract :
The DC erasure process in a 5 Gbits/in2 medium is investigated using magnetic force microscopy (MFM). 50 to 250 kfci patterns were imaged in the remanent state after application of in situ magnetic fields perpendicular H⊥ and parallel H| to the tracks. Degradation of bits is observed to start at the track edges and the transitions. Decay at the transition tends to occur locally at many places and propagates into the bits with opposing magnetization relative to H|. For H⊥, decay occurs on both sides of the transition and the written bits persist at higher fields compared to the application of H|. For the H | case, the averaged MFM signal for 50 to 250 kfci patterns fits the bulk DC demagnetization curve suggesting the reduced effect of demagnetizing fields
Keywords :
Barkhausen effect; chromium alloys; cobalt alloys; demagnetisation; ferromagnetic materials; magnetic force microscopy; magnetic recording; remanence; CoCrPtTa-CrMo; DC erasure; averaged MFM signal; bit degradation; bulk DC demagnetization curve; demagnetizing fields; magnetic force microscopy studies; remanent state; track edges; written bits; Force measurement; Hall effect devices; Magnetic field measurement; Magnetic flux; Magnetic force microscopy; Magnetic forces; Magnetic properties; Magnetic separation; Magnetization; Magnetostatics;
Journal_Title :
Magnetics, IEEE Transactions on
