DocumentCode :
1362331
Title :
Extending the Best Linear Approximation to Characterize the Nonlinear Distortion in GaN HEMTs
Author :
Thorsell, Mattias ; Andersson, Kristoffer ; Pailloncy, Guillaume ; Rolain, Yves
Author_Institution :
GigaHertz Centre, Chalmers Univ. of Technol., Göteborg, Sweden
Volume :
59
Issue :
12
fYear :
2011
Firstpage :
3087
Lastpage :
3094
Abstract :
In this paper, the best linear approximation (BLA) is extended to include second-order nonlinearities. This extension is particularly useful for the analysis of low-frequency (LF) distortion due to self-mixing. The self-mixing of a modulated signal due to even-order nonlinear distortion creates a spectrum around dc, as well as around the high order even harmonics. The frequency response at dc can be used to determine long-term memory effects such as trapping and self-heating. The extended BLA is extracted for a GaN-based HEMT to analyze the LF distortion and demonstrate the possibilities with the proposed method.
Keywords :
III-V semiconductors; approximation theory; gallium compounds; high electron mobility transistors; wide band gap semiconductors; GaN; HEMT; best linear approximation; low-frequency distortion; nonlinear distortion; second-order nonlinearities; self-heating; self-mixing; trapping; Gallium nitride; HEMTs; Harmonic analysis; Linear approximation; Noise measurement; Nonlinear distortion; Linear approximation; gallium nitride (GaN); high electron-mobility transistors (HEMTs); linear characteristics; nonlinear distortion;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2011.2169423
Filename :
6061918
Link To Document :
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