Title :
Media Corrosion: Not Just an Overcoat Problem
Author :
Dai, Q. ; Marchon, B. ; Do, H. ; Takano, K. ; Wang, J.L.
Author_Institution :
San Jose Res. Center, Hitachi Global Storage Technol. Inc., San Jose, CA, USA
Abstract :
This paper demonstrates that electrochemical impedance spectroscopy combined with atomic force microscopy analysis can successfully characterize the coverage ability of an overcoat on perpendicular magnetic recording media. Rougher media, brought about by lower surface energy oxide segregants, can adversely impact the overcoat integrity. The role of the capping layer, and its ability to somewhat planarize the overall structure, is also discussed.
Keywords :
atomic force microscopy; corrosion; electrochemical impedance spectroscopy; oxidation; perpendicular magnetic recording; protective coatings; surface roughness; atomic force microscopy analysis; capping layer; coverage ability; electrochemical impedance spectroscopy; media corrosion; overcoat integrity; perpendicular magnetic recording media; surface energy oxide segregants; Atomic force microscopy; Corrosion; Dielectrics; Electrochemical impedance spectroscopy; Electrodes; Frequency; Land mobile radio; Magnetic recording; Perpendicular magnetic recording; Silicon compounds; EIS; PMR corrosion; overcoat; roughness;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2009.2034473
