DocumentCode :
1362538
Title :
Using Embedded Dynamic Random Access Memory to Reduce Energy Consumption of Magnetic Recording Read Channel
Author :
Xie, Ningde ; Zhang, Tong ; Haratsch, Erich F.
Author_Institution :
ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
46
Issue :
1
fYear :
2010
Firstpage :
87
Lastpage :
91
Abstract :
Although the performance of a magnetic recording read channel can be improved by employing advanced iterative signal detection and coding techniques, the method nevertheless tends to incur significant silicon area and energy consumption overhead. Motivated by recent significant improvement of high-density embedded dynamic random access memory (eDRAM) towards high manufacturability at low cost, we explored the potential of integrating eDRAM in read channel integrated circuits (IC) to minimize the silicon area and energy consumption cost incurred by iterative signal detection and coding. As a result of the memory-intensive nature of iterative signal detection and coding algorithms, the silicon cost can be reduced in a straightforward manner by directly replacing conventional SRAM with eDRAM. However, reducing the energy consumption may not be trivial. In this paper, we present two techniques that trade eDRAM storage capacity to reduce the energy consumption of iterative signal detection and coding datapath. We have demonstrated dDRAM´s energy saving potential by designing a representative iterative read channel at the 65 nm technology node. Simulation shows that we can eliminate over 99.99% of post-processing computation for dominant error events detection, and achieve up to a 67% reduction of decoding energy consumption.
Keywords :
DRAM chips; embedded systems; energy consumption; iterative methods; magnetic recording; parity check codes; signal detection; coding technique; decoding energy consumption; embedded dynamic random access memory; energy consumption overhead; iterative signal detection; magnetic recording read channel; read channel integrated circuits; silicon area overhead; Costs; DRAM chips; Energy consumption; Integrated circuit manufacture; Iterative algorithms; Iterative methods; Magnetic recording; Random access memory; Signal detection; Silicon; Embedded dynamic random access memory (DRAM); energy consumption; low-density parity check (LDPC);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2009.2026898
Filename :
5357506
Link To Document :
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