Space-charge wave considerations in MIS waveguide analysis

Author

Han, Keli ; Wong, Thomas T Y

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA

Volume

39

Issue

7

fYear

1991

fDate

7/1/1991 12:00:00 AM

Firstpage

1126

Lastpage

1132

Abstract

A transport-based small-signal analysis of the fundamental mode of propagation in a metal-insulator-semiconductor (MIS) waveguide is presented. The formulation incorporates the full set of Maxwell´s equations and the equations of motion of the carriers based on a drift-diffusion model, providing a quantitative description of the space-charge wave induced of the surface of the semiconductor. Effects of an external DC bias on the propagation characteristics are also accounted for. Numerical solutions to the system of equations for a waveguide with typical material parameters and dimensions are obtained using an iterative algorithm. Results indicate that the transverse component of the electric field in the semiconductor is strongly influenced by the screening effect of the charge carriers, whereas the longitudinal component is governed mainly by energy dissipation arising from the conduction current

Keywords

metal-insulator-semiconductor structures; waveguide theory; waveguides; MIS waveguide analysis; Maxwell´s equations; drift-diffusion model; equations of motion; external DC bias; fundamental mode of propagation; iterative algorithm; metal insulating semiconductor waveguide; propagation characteristics; space-charge wave; transport-based small-signal analysis; Charge carrier processes; Charge carriers; Conducting materials; Energy dissipation; Magnetic multilayers; Maxwell equations; Metal-insulator structures; Microwave devices; Semiconductor waveguides; Surface waves;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.85379

Filename

85379