• DocumentCode
    1362710
  • Title

    A cooled 1-2 GHz balanced HEMT amplifier

  • Author

    Padin, Stephen ; Ortiz, Gerardo G.

  • Author_Institution
    Owens Valley Radio Obs., California Inst. of Technol., Big Pine, CA, USA
  • Volume
    39
  • Issue
    7
  • fYear
    1991
  • fDate
    7/1/1991 12:00:00 AM
  • Firstpage
    1239
  • Lastpage
    1243
  • Abstract
    The design details and measurement results for a cooled 1-GHz-bandwidth L-band high electron mobility transistor (HEMT) amplifier are presented. No facilities-were available for measuring low-temperature S parameters, but the HEMT noise parameters were measured at a physical temperature of 12 K. The absence of S-parameter information precluded the design of a feedback amplifier, so a balanced configuration was adopted. This has the advantage of providing a good input match even though the amplifiers in the two arms of the balanced circuit are poorly matched. However, there are disadvantages. The loss of the input hybrid degrades the noise temperature and coupling errors in the hybrids, and differences between the amplifiers reduce the gain and result in a noise contribution from the input load. In the amplifier described, these effects degrade the noise temperature by less than 1 K. The amplifier uses commercially available packaged HEMT devices. At a physical temperature of 12 K the amplifier achieves noise temperatures between 3 and 6 K over the 1 to 2 GHz band. The associated gain is approximately 20 dB.
  • Keywords
    electron device noise; high electron mobility transistors; microwave amplifiers; solid-state microwave circuits; wideband amplifiers; 1 GHz; 1 to 2 GHz; 12 K; 20 dB; L-band high electron mobility transistor; LNA; UHF; balanced HEMT amplifier; commercially available packaged HEMT devices; coupling errors; cryogenically cooled amplifiers; design details; gain; measurement results; noise parameters; noise temperature; physical temperature; Circuit noise; Degradation; Feedback amplifiers; HEMTs; L-band; MODFETs; Noise measurement; Noise reduction; Scattering parameters; Temperature;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.85395
  • Filename
    85395