• DocumentCode
    1362845
  • Title

    Stretchable EMI Measurement Sheet With 8 \\times 8 Coil Array, 2 V Organic CMOS Decoder, and 0.18  \\mu <

  • Author

    Ishida, Koichi ; Masunaga, Naoki ; Zhou, Zhiwei ; Yasufuku, Tadashi ; Sekitani, Tsuyoshi ; Zschieschang, Ute ; Klauk, Hagen ; Takamiya, Makoto ; Someya, Takao ; Sakurai, Takayasu

  • Author_Institution
    Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
  • Volume
    45
  • Issue
    1
  • fYear
    2010
  • Firstpage
    249
  • Lastpage
    259
  • Abstract
    A stretchable 12 ?? 12 cm2 electromagnetic interference (EMI) measurement sheet is developed to enable the measurement of EMI distribution on the surface of electronic devices by wrapping the devices in the sheet. The sheet consists of an 8 ?? 8 coil array, a 2 V organic CMOS row decoder and a column selector, 40% stretchable interconnects with carbon nanotubes, and 0.18 μm silicon CMOS circuits for electric and magnetic field detection. The sheet detects the total power of an electric field in the band up to 700 MHz and that of a magnetic field up to 1 GHz. The minimum detectable powers of the electric and magnetic fields are -60 and -70 dBm, respectively.
  • Keywords
    CMOS integrated circuits; carbon nanotubes; coils; electric fields; electromagnetic interference; integrated circuit interconnections; large scale integration; magnetic fields; silicon; CMOS row decoder; carbon nanotube; coil array; electric field detection; electromagnetic interference measurement sheet; electronic device; magnetic field detection; organic CMOS decoder; silicon CMOS LSI; size 0.18 μm; stretchable EMI measurement sheet; stretchable interconnects; voltage 2 V; Carbon nanotubes; Coils; Decoding; Electromagnetic interference; Electromagnetic measurements; Integrated circuit interconnections; Magnetic circuits; Magnetic fields; Silicon; Wrapping; 2 V organic CMOS; Calibration; carbon nanotubes; direct silicon-organic circuit interface; down conversion; electric filed; electromagnetic interference; frequency discrimination; intrasystem electromagnetic compatibility; localization; magnetic field; silicon CMOS; stretchable interconnects; stretchable measurement sheet;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2009.2034446
  • Filename
    5357559