DocumentCode :
1362845
Title :
Stretchable EMI Measurement Sheet With 8 \\times 8 Coil Array, 2 V Organic CMOS Decoder, and 0.18  \\mu <
Author :
Ishida, Koichi ; Masunaga, Naoki ; Zhou, Zhiwei ; Yasufuku, Tadashi ; Sekitani, Tsuyoshi ; Zschieschang, Ute ; Klauk, Hagen ; Takamiya, Makoto ; Someya, Takao ; Sakurai, Takayasu
Author_Institution :
Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
Volume :
45
Issue :
1
fYear :
2010
Firstpage :
249
Lastpage :
259
Abstract :
A stretchable 12 ?? 12 cm2 electromagnetic interference (EMI) measurement sheet is developed to enable the measurement of EMI distribution on the surface of electronic devices by wrapping the devices in the sheet. The sheet consists of an 8 ?? 8 coil array, a 2 V organic CMOS row decoder and a column selector, 40% stretchable interconnects with carbon nanotubes, and 0.18 μm silicon CMOS circuits for electric and magnetic field detection. The sheet detects the total power of an electric field in the band up to 700 MHz and that of a magnetic field up to 1 GHz. The minimum detectable powers of the electric and magnetic fields are -60 and -70 dBm, respectively.
Keywords :
CMOS integrated circuits; carbon nanotubes; coils; electric fields; electromagnetic interference; integrated circuit interconnections; large scale integration; magnetic fields; silicon; CMOS row decoder; carbon nanotube; coil array; electric field detection; electromagnetic interference measurement sheet; electronic device; magnetic field detection; organic CMOS decoder; silicon CMOS LSI; size 0.18 μm; stretchable EMI measurement sheet; stretchable interconnects; voltage 2 V; Carbon nanotubes; Coils; Decoding; Electromagnetic interference; Electromagnetic measurements; Integrated circuit interconnections; Magnetic circuits; Magnetic fields; Silicon; Wrapping; 2 V organic CMOS; Calibration; carbon nanotubes; direct silicon-organic circuit interface; down conversion; electric filed; electromagnetic interference; frequency discrimination; intrasystem electromagnetic compatibility; localization; magnetic field; silicon CMOS; stretchable interconnects; stretchable measurement sheet;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2009.2034446
Filename :
5357559
Link To Document :
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