Title :
Experimental analysis of transmission line parameters in high-speed GaAs digital circuit interconnects
Author :
Kiziloglu, Kiirgad ; Dagli, Nadir ; Matthaei, George L. ; Long, Stephen I.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fDate :
8/1/1991 12:00:00 AM
Abstract :
Transmission line properties of typical high-speed interconnects were experimentally investigated by fabricating and characterizing coplanar strips on semi-insulating GaAs substrates. The strips have thicknesses of about 2500 Å or 5000 Å and widths of 4, 6, or 8 μm so as to be representative of on-chip interconnects in high-speed GaAs digital circuits. Measurements are carried out up to 18 GHz, and the pertinent line parameters, such as resistance, capacitance per unit length, and characteristic impedance, are extracted using the measured S-parameters. The measurement results confirm the quasi-TEM properties of such interconnects. In all cases, the measured distributed capacitance and inductance are sensitive to frequency whereas the resistance is found to increase as much as 38% for the widest and thickest conductors
Keywords :
III-V semiconductors; S-parameters; digital integrated circuits; gallium arsenide; monolithic integrated circuits; strip line components; 18 GHz; 4 to 8 micron; GaAs; S-parameters; capacitance per unit length; characteristic impedance; coplanar strips; digital circuit interconnects; distributed capacitance; distributed inductance; high-speed interconnects; quasi-TEM properties; resistance; semi-insulating GaAs substrates; transmission line parameters; Capacitance measurement; Coplanar transmission lines; Digital circuits; Electrical resistance measurement; Gallium arsenide; Impedance measurement; Integrated circuit interconnections; Length measurement; Strips; Transmission lines;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
