DocumentCode
1363145
Title
Monolithic integration of AlGaAs/GaAs HBT and GaAs junction-gate floated electron channel field effect transistor using selective MOCVD growth
Author
Hyunchol Shin ; Jeong-Hwan Son ; Young-Se Kwon
Author_Institution
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
Volume
6
Issue
9
fYear
1996
Firstpage
317
Lastpage
319
Abstract
A novel GaAs BiFET structure based on AlGaAs/GaAs HBT and GaAs junction-gate floated electron channel field effect transistor (J-FECFET) has been developed. Selective metalorganic chemical vapor deposition (MOCVD) growth is extensively used for the BiFET. Structural advantage of the BiFET is that the epitaxial layers of the J-FECFET are identical to the lower part of a conventional heterojunction bipolar transistor (HBT). Transconductance of the fabricated J-FECFET with 1×200 μm2 gate is 102 mS/mm with fT and fmax of 10.7 GHz and 27.3 GHz, respectively. DC current gain of HBT is 21 at a collector current density of 50 kA/cm2 with emitter area of 3×2 μm2. The new integration technology offer a foundation for development of various multifunction monolithic microwave integrated circuits (MMIC´s).
Keywords
III-V semiconductors; MMIC; gallium arsenide; heterojunction bipolar transistors; integrated circuit technology; junction gate field effect transistors; vapour phase epitaxial growth; 10.7 GHz; 102 mS/mm; 27.3 GHz; AlGaAs-GaAs; AlGaAs/GaAs HBT; BiFET structure; GaAs; GaAs JFECFET; SHF; VPE; epitaxial layers; field effect transistor; floated electron channel JFET; heterojunction bipolar transistor; integration technology; junction-gate FET; metalorganic chemical vapor deposition; monolithic integration; monolithic microwave integrated circuits; multifunction MMIC; selective MOCVD growth; Chemical vapor deposition; Current density; Electrons; Epitaxial layers; FETs; Gallium arsenide; Heterojunction bipolar transistors; MOCVD; Monolithic integrated circuits; Transconductance;
fLanguage
English
Journal_Title
Microwave and Guided Wave Letters, IEEE
Publisher
ieee
ISSN
1051-8207
Type
jour
DOI
10.1109/75.535831
Filename
535831
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