Author :
Castello, Rinaldo ; Heimisch, W.
fDate :
7/1/1992 12:00:00 AM
Keywords :
BiCMOS integrated circuits; CMOS technology; Circuit testing; Digital circuits; Digital signal processing chips; Europe; Pulp and paper industry; Solid state circuits; Telecommunications; Terrorism;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1992.854934