DocumentCode
1363425
Title
Forward
Author
Castello, Rinaldo ; Heimisch, W.
Volume
27
Issue
7
fYear
1992
fDate
7/1/1992 12:00:00 AM
Firstpage
955
Lastpage
956
Keywords
BiCMOS integrated circuits; CMOS technology; Circuit testing; Digital circuits; Digital signal processing chips; Europe; Pulp and paper industry; Solid state circuits; Telecommunications; Terrorism;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1992.854934
Filename
854934
Link To Document