Title : 
Ultralow-noise programmable voltage source
         
        
            Author : 
Baracchino, Luigi ; Basso, Giovanni ; Ciofi, Carmine ; Neri, Bruno
         
        
            Author_Institution : 
Dipt. di Ingegneria dell´´Inf., Pisa Univ., Italy
         
        
        
        
        
            fDate : 
12/1/1997 12:00:00 AM
         
        
        
        
            Abstract : 
To avoid introducing additional noise sources while making low-frequency noise measurements, batteries are normally used instead of electronic power supplies. This paper presents an alternative solution by describing the design, construction, and testing of an ultralow-noise voltage source. Such a power supply can be computer controlled and has a typical noise level two orders of magnitude below that of similar commercial instruments. Some typical values of the spectral density of the voltage fluctuations at its output are: (10-12, 10-15, 10-16) V2/Hz at (0.01, 0.1, and 1) Hz, respectively. These noise performances are almost independent of the supplied current, with a degradation of less than 3 dB up to 400 mA. A special algorithm for digital-to-analog conversion, using passive devices with 1% tolerance, ensures a resolution of 2.5 mV and an accuracy better than ±1.5 mV over the entire output range from 0 to 8 V
         
        
            Keywords : 
automatic test equipment; circuit noise; electric noise measurement; power supplies to apparatus; semiconductor device testing; 0 to 8 V; 0.001 Hz; 0.1 Hz; 1 Hz; 3 dB; 400 mA; algorithm; circuit noise; computer controlled; construction; degradation; design; digital-to-analog conversion; low-frequency noise measurements; noise performances; noise sources; passive devices; semiconductor device testing; spectral density; testing; voltage fluctuations; Battery charge measurement; Current supplies; Instruments; Low-frequency noise; Noise level; Noise measurement; Power measurement; Power supplies; Testing; Voltage fluctuations;
         
        
        
            Journal_Title : 
Instrumentation and Measurement, IEEE Transactions on