• DocumentCode
    1363687
  • Title

    Ultralow-noise programmable voltage source

  • Author

    Baracchino, Luigi ; Basso, Giovanni ; Ciofi, Carmine ; Neri, Bruno

  • Author_Institution
    Dipt. di Ingegneria dell´´Inf., Pisa Univ., Italy
  • Volume
    46
  • Issue
    6
  • fYear
    1997
  • fDate
    12/1/1997 12:00:00 AM
  • Firstpage
    1256
  • Lastpage
    1261
  • Abstract
    To avoid introducing additional noise sources while making low-frequency noise measurements, batteries are normally used instead of electronic power supplies. This paper presents an alternative solution by describing the design, construction, and testing of an ultralow-noise voltage source. Such a power supply can be computer controlled and has a typical noise level two orders of magnitude below that of similar commercial instruments. Some typical values of the spectral density of the voltage fluctuations at its output are: (10-12, 10-15, 10-16) V2/Hz at (0.01, 0.1, and 1) Hz, respectively. These noise performances are almost independent of the supplied current, with a degradation of less than 3 dB up to 400 mA. A special algorithm for digital-to-analog conversion, using passive devices with 1% tolerance, ensures a resolution of 2.5 mV and an accuracy better than ±1.5 mV over the entire output range from 0 to 8 V
  • Keywords
    automatic test equipment; circuit noise; electric noise measurement; power supplies to apparatus; semiconductor device testing; 0 to 8 V; 0.001 Hz; 0.1 Hz; 1 Hz; 3 dB; 400 mA; algorithm; circuit noise; computer controlled; construction; degradation; design; digital-to-analog conversion; low-frequency noise measurements; noise performances; noise sources; passive devices; semiconductor device testing; spectral density; testing; voltage fluctuations; Battery charge measurement; Current supplies; Instruments; Low-frequency noise; Noise level; Noise measurement; Power measurement; Power supplies; Testing; Voltage fluctuations;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.668267
  • Filename
    668267