Title :
A simple built-in current sensor for current monitoring in mixed-signal circuits
Author :
Siskos, S. ; Hatzopoulos, A.A.
Author_Institution :
Dept. of Phys., Aristotelian Univ. of Thessaloniki, Greece
fDate :
12/1/1997 12:00:00 AM
Abstract :
Quiescent current monitoring is an interesting and efficient technique for mixed-signal testing where fault detection of analog parts requires the precise measure of the Iddq. This paper presents a very simple current sensor for on-chip current monitoring giving a precise analog output proportional to the quiescent current. Simulations show feasibility of the sensor to operate at high frequencies. This circuit may also operate at low supply voltage (±1.5 V), and due to its simplicity, the silicon area overhead is very small
Keywords :
built-in self test; digital simulation; electric current measurement; electric sensing devices; fault location; integrated circuit testing; mixed analogue-digital integrated circuits; 1.5 V; Iddq; Si area overhead; analogue IC; built-in current sensor; current monitoring; current sensor; fault detection; mixed-signal circuits; on-chip current monitoring; quiescent current; quiescent current monitoring; self testing; simulations; Analog integrated circuits; Circuit faults; Circuit testing; Condition monitoring; Current measurement; Current supplies; Electrical fault detection; Fault tolerant systems; Frequency; Integrated circuit testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
