A simple built-in current sensor for current monitoring in mixed-signal circuits

Author

Siskos, S. ; Hatzopoulos, A.A.

Author_Institution

Dept. of Phys., Aristotelian Univ. of Thessaloniki, Greece

Volume

46

Issue

6

fYear

1997

fDate

12/1/1997 12:00:00 AM

Firstpage

1301

Lastpage

1304

Abstract

Quiescent current monitoring is an interesting and efficient technique for mixed-signal testing where fault detection of analog parts requires the precise measure of the I_ddq. This paper presents a very simple current sensor for on-chip current monitoring giving a precise analog output proportional to the quiescent current. Simulations show feasibility of the sensor to operate at high frequencies. This circuit may also operate at low supply voltage (±1.5 V), and due to its simplicity, the silicon area overhead is very small

Keywords

built-in self test; digital simulation; electric current measurement; electric sensing devices; fault location; integrated circuit testing; mixed analogue-digital integrated circuits; 1.5 V; I_ddq; Si area overhead; analogue IC; built-in current sensor; current monitoring; current sensor; fault detection; mixed-signal circuits; on-chip current monitoring; quiescent current; quiescent current monitoring; self testing; simulations; Analog integrated circuits; Circuit faults; Circuit testing; Condition monitoring; Current measurement; Current supplies; Electrical fault detection; Fault tolerant systems; Frequency; Integrated circuit testing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.668284

Filename

668284