DocumentCode :
1363830
Title :
Influence of Sampling Voltmeter Parameters on RMS Measurements of Josephson Stepwise-Approximated Sine Waves
Author :
Van den Brom, Helko E. ; Houtzager, Ernest ; Verhoeckx, Sjoerd ; Martina, Quincy E V N ; Rietveld, Gert
Author_Institution :
VSL, Delft, Netherlands
Volume :
58
Issue :
10
fYear :
2009
Firstpage :
3806
Lastpage :
3812
Abstract :
A binary Josephson-array voltage standard was used to investigate the influence of device settings on the reading of an 81/2-digit sampling voltmeter. This voltmeter is the heart of the primary standard for power at 50 Hz or 60 Hz at several National Metrology Institutes (NMIs). In this paper, we present results on the influence of the voltmeter synchronization and measurement parameters on the root-mean-square (RMS) measurements of Josephson stepwise-approximated sine waves for different frequencies. Our results show that for aperture times above 100 mus, the measured RMS voltage shows a large step in value with respect to shorter aperture times and is much more accurate. Furthermore, to obtain 0.2 muV/V accuracy, we show that for stepwise-approximated sine waves at 53 Hz, delay times higher than 10 mus are necessary. A slight delay time dependence limits the accuracy for frequencies above a few hundred hertz.
Keywords :
Josephson effect; measurement standards; sampling methods; voltage measurement; voltmeters; Josephson stepwise-approximated sine waves; National Metrology Institutes; RMS measurement; binary Josephson-array voltage standard; frequency 50 Hz; frequency 53 Hz; frequency 60 Hz; root-mean-square measurements; sampling voltmeter parameter; AC Josephson voltage standards; binary Josephson arrays; measurement standards; sampling voltmeter; voltage measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2009.2019720
Filename :
5232868
Link To Document :
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