Title :
Instrumentation: VLSI chips present new challenges for testing, while personal computers and local networks lead to new approaches
Author_Institution :
IEEE Spectrum, New York, NY, USA
Abstract :
Advances in test and measurement equipment are discussed. These include: new approaches using personal computers and local networks; the use of databases, particularly for VLSI testing; and the growing use of color-screen oscilloscopes.
Keywords :
automatic test equipment; cathode-ray oscilloscopes; computerised instrumentation; integrated circuit testing; measurement systems; VLSI testing; automatic test equipment; cathode ray oscilloscopes; color-screen oscilloscopes; computerised instrumentation; databases; integrated circuit testing; local networks; measurement systems; personal computers; test and measurement equipment; Companies; Computers; Image color analysis; Instruments; Software; Testing; Very large scale integration;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1984.6370143
