DocumentCode :
1363982
Title :
Kudos to our reviewers
Author :
Verret, Doug
Author_Institution :
Texas Instruments, Inc., Houston, TX, USA
Volume :
57
Issue :
12
fYear :
2010
Firstpage :
3195
Lastpage :
3195
Abstract :
The publication offers a note of thanks and lists its reviewers.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2010.2089212
Filename :
5613156
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1363982
