• DocumentCode
    1363994
  • Title

    Reduction of the Impact of Distortion Outliers and Source Mismatch in Resolution-Constrained Quantization

  • Author

    Kim, Moo Young ; Kleijn, W. Bastiaan

  • Author_Institution
    Dept. of Inf. & Commun. Eng., Sejong Univ., Seoul, South Korea
  • Volume
    18
  • Issue
    6
  • fYear
    2010
  • Firstpage
    1218
  • Lastpage
    1227
  • Abstract
    The rate-distortion performance of conventional resolution-constrained quantization (RCQ) based on the mean-squared error criterion (MSE-RCQ) is generally compromised by the impact of distortion outliers and source mismatch. Not only the mean distortion, but also the number of distortion outliers should be considered in quantizer design. Thus, we propose the use of a design criterion that gives more importance to the tail of the source distribution, which leads to RCQ based on the second moment of distortion (SMD-RCQ). A continuous range of alternatives between MSE-RCQ and SMD-RCQ is also defined and implemented based on the weighted arithmetic-mean measure (WAM-RCQ). It can be used to control the centroid density in the tail of the source distribution. Experimental results with a Gaussian source and line spectral frequencies (LSFs) show that the proposed WAM-RCQ not only produces a similar mean distortion as conventional MSE-RCQ, but has a lower percentage of distortion outliers and a significantly reduced sensitivity to source mismatch.
  • Keywords
    mean square error methods; nonlinear distortion; quantisation (signal); source coding; Gaussian source; SMD-RCQ; WAM-RCQ; distortion outliers; line spectral frequencies; mean squared error criterion; resolution constrained quantization; second moment-of -distortion; source distribution; source mismatch; weighted arithmetic mean measure; High-rate theory; distortion outliers; quantization; robust quantization; source coding; source mismatch;
  • fLanguage
    English
  • Journal_Title
    Audio, Speech, and Language Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1558-7916
  • Type

    jour

  • DOI
    10.1109/TASL.2009.2031701
  • Filename
    5232892