DocumentCode :
1364022
Title :
Noise of the JFET amplifier
Author :
Levinzon, Felix A.
Author_Institution :
Endevco Corp., San Juan Capistrano, CA, USA
Volume :
47
Issue :
7
fYear :
2000
fDate :
7/1/2000 12:00:00 AM
Firstpage :
981
Lastpage :
985
Abstract :
By analyzing the different noise sources of the silicon JFET amplifier, engineering formulae for equivalent noise voltage referred to the input of the JFET amplifier are derived. Formulae are obtained for common signal source impedance and particularly for capacitance-type signal source impedance. If the parameters of the JFET, the signal source, and the load are known, these formulae can he used to estimate the overall noise of the JFET amplifier over a wide frequency band. The theoretical curve of the overall equivalent noise voltage spectral density at frequencies from 0.5 Hz to 50 kHz has good correlation to a measured experimental curve. The contribution of the different noise sources to the overall noise is shown. For modern low-noise JFET´s, 1/f noise prevails over the channel thermal noise at frequencies f⩽100 Hz. When using high-capacitance-type signal source impedance, contribution of the biasing resistor thermal noise to the overall noise predominates at low frequencies f⩾1 kHz and room temperature. At upper frequencies f⩾1 kHz, overall noise is due mainly to the JFET´s thermal channel noise
Keywords :
1/f noise; JFET circuits; circuit noise; thermal noise; wideband amplifiers; 0.5 Hz to 50 kHz; 1/f noise; JFET amplifier; biasing resistor; capacitance-type signal source impedance; channel noise; common signal source impedance; equivalent noise voltage; equivalent noise voltage spectral density; noise sources; thermal noise; Capacitance; Density measurement; Frequency estimation; Frequency measurement; Impedance; Low-frequency noise; Noise measurement; Silicon; Thermal resistance; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.855453
Filename :
855453
Link To Document :
بازگشت