A nonparametric approach to estimate system burn-in time

Author

Chien, Wei Ting Kary ; Kuo, Way

Author_Institution

Texas A&M Univ., College Station, TX, USA

Volume

9

Issue

3

fYear

1996

fDate

8/1/1996 12:00:00 AM

Firstpage

461

Lastpage

467

Abstract

System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among components, but also among different subsystems and at the system level. There are two major disadvantages for performing the system burn-in: the high burn-in cost and the complicated failure rate function. This paper proposes a nonparametric approach to estimate the optimal system burn-in time. The Anderson-Darling statistic is used to check the constant failure rate (CFR), and the pool-adjacent-violator (PAV) algorithm is applied to “unimodalize” the failure rate curve. Given experimental data, the system burn-in time can be determined easily without going through complex parameter estimation and curve fittings

Keywords

failure analysis; integrated circuit reliability; nonparametric statistics; Anderson-Darling statistic; constant failure rate; failure rate curve; nonparametric approach; pool-adjacent-violator algorithm; residual defects; system burn-in time; Bayesian methods; Cost function; Curve fitting; Failure analysis; Information analysis; Parameter estimation; Statistics; Stress; Temperature; Voltage;

fLanguage

English

Journal_Title

Semiconductor Manufacturing, IEEE Transactions on

Publisher

ieee

ISSN

0894-6507

Type

jour

DOI

10.1109/66.536117

Filename

536117