DocumentCode :
1364146
Title :
Robust BME Class-I MLCCs for Harsh-Environment Applications
Author :
Xu, Xilin ; Gurav, Abhijit S. ; Lessner, Philip M. ; Randall, Clive A.
Author_Institution :
KEMET Electron. Corp., Greenville, SC, USA
Volume :
58
Issue :
7
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
2636
Lastpage :
2643
Abstract :
For applications at temperatures of 150°C or above, such as in automotive under the hood electronics and power electronics, a robust dielectric material is necessary for capacitors. In traditional X8R products [Electronic Industries Alliance (EIA) specification, AC/C within ±15% between -55°C and +150°C compared to that at 25°C], the dielectric material is designed for applications up to 150°C. However, at temperatures above 150°C, these typically suffer from degradation of reliability performance and severe reduction in capacitance, particularly under dc bias conditions. Recently, a Class-I dielectric material has been developed using nickel electrodes for high-temperature application up to 200°C. Due to its linear dielectric nature, this material exhibits highly stable capacitance as a function of temperature and voltage. Multilayer ceramic capacitors made from this material can be qualified as X9G with robust reliability. This paper will report electrical properties and reliability test data on these Class-I ceramic capacitors at temperatures ≥ 150°C. In addition, test data from D - E curves and energy density measurements will be reported along with a discussion of possible mechanisms behind the robust reliability of this material.
Keywords :
ceramic capacitors; dielectric materials; nickel; BME class-1 multilayer ceramic capacitor; X8R products; automotive; class-1 dielectric material; electrical property; energy density measurement; harsh-environment application; hood electronics; linear dielectric nature; material reliability; nickel electrode; power electronics; robust dielectric material; temperature -55 C to 150 C; Capacitance; Capacitors; Materials; Reliability; Temperature; Temperature measurement; Capacitors; dielectric materials; energy density; high temperature; reoxidation;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2010.2089934
Filename :
5613181
Link To Document :
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