DocumentCode
1364146
Title
Robust BME Class-I MLCCs for Harsh-Environment Applications
Author
Xu, Xilin ; Gurav, Abhijit S. ; Lessner, Philip M. ; Randall, Clive A.
Author_Institution
KEMET Electron. Corp., Greenville, SC, USA
Volume
58
Issue
7
fYear
2011
fDate
7/1/2011 12:00:00 AM
Firstpage
2636
Lastpage
2643
Abstract
For applications at temperatures of 150°C or above, such as in automotive under the hood electronics and power electronics, a robust dielectric material is necessary for capacitors. In traditional X8R products [Electronic Industries Alliance (EIA) specification, AC/C within ±15% between -55°C and +150°C compared to that at 25°C], the dielectric material is designed for applications up to 150°C. However, at temperatures above 150°C, these typically suffer from degradation of reliability performance and severe reduction in capacitance, particularly under dc bias conditions. Recently, a Class-I dielectric material has been developed using nickel electrodes for high-temperature application up to 200°C. Due to its linear dielectric nature, this material exhibits highly stable capacitance as a function of temperature and voltage. Multilayer ceramic capacitors made from this material can be qualified as X9G with robust reliability. This paper will report electrical properties and reliability test data on these Class-I ceramic capacitors at temperatures ≥ 150°C. In addition, test data from D - E curves and energy density measurements will be reported along with a discussion of possible mechanisms behind the robust reliability of this material.
Keywords
ceramic capacitors; dielectric materials; nickel; BME class-1 multilayer ceramic capacitor; X8R products; automotive; class-1 dielectric material; electrical property; energy density measurement; harsh-environment application; hood electronics; linear dielectric nature; material reliability; nickel electrode; power electronics; robust dielectric material; temperature -55 C to 150 C; Capacitance; Capacitors; Materials; Reliability; Temperature; Temperature measurement; Capacitors; dielectric materials; energy density; high temperature; reoxidation;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/TIE.2010.2089934
Filename
5613181
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