• DocumentCode
    1364146
  • Title

    Robust BME Class-I MLCCs for Harsh-Environment Applications

  • Author

    Xu, Xilin ; Gurav, Abhijit S. ; Lessner, Philip M. ; Randall, Clive A.

  • Author_Institution
    KEMET Electron. Corp., Greenville, SC, USA
  • Volume
    58
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    2636
  • Lastpage
    2643
  • Abstract
    For applications at temperatures of 150°C or above, such as in automotive under the hood electronics and power electronics, a robust dielectric material is necessary for capacitors. In traditional X8R products [Electronic Industries Alliance (EIA) specification, AC/C within ±15% between -55°C and +150°C compared to that at 25°C], the dielectric material is designed for applications up to 150°C. However, at temperatures above 150°C, these typically suffer from degradation of reliability performance and severe reduction in capacitance, particularly under dc bias conditions. Recently, a Class-I dielectric material has been developed using nickel electrodes for high-temperature application up to 200°C. Due to its linear dielectric nature, this material exhibits highly stable capacitance as a function of temperature and voltage. Multilayer ceramic capacitors made from this material can be qualified as X9G with robust reliability. This paper will report electrical properties and reliability test data on these Class-I ceramic capacitors at temperatures ≥ 150°C. In addition, test data from D - E curves and energy density measurements will be reported along with a discussion of possible mechanisms behind the robust reliability of this material.
  • Keywords
    ceramic capacitors; dielectric materials; nickel; BME class-1 multilayer ceramic capacitor; X8R products; automotive; class-1 dielectric material; electrical property; energy density measurement; harsh-environment application; hood electronics; linear dielectric nature; material reliability; nickel electrode; power electronics; robust dielectric material; temperature -55 C to 150 C; Capacitance; Capacitors; Materials; Reliability; Temperature; Temperature measurement; Capacitors; dielectric materials; energy density; high temperature; reoxidation;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2010.2089934
  • Filename
    5613181