DocumentCode :
136423
Title :
Research on HVIGBT transient mixture model and parameter extraction method
Author :
Gaohui Feng ; Zhengming Zhao ; Liqiang Yuan ; Shiqi Ji ; Jincheng Zhao
Author_Institution :
State Key Lab. of Control & Simulation of Power Syst. & Generation Equip., Tsinghua Univ., Beijing, China
fYear :
2014
fDate :
Aug. 31 2014-Sept. 3 2014
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents a kind of HVIGBT transient mixture model and corresponding parameter extraction method. The HVIGBT model can divide into MOSFET and BJT two parts. The two models are formed respectively according to HVIGBT work principle, in addition, the carrier transport equations have been simplified for avoiding Kirk effect in BJT model. The transient model is realized in PSIM software in the paper. Extraction methods, which include estimation by empirical values, calculation by testing waveforms and comparison with same type models, are adopted in extracting model parameters. Through comparing testing and simulation waveforms, the model´s simulation accuracy is proved.
Keywords :
Boltzmann equation; MOSFET; Poisson equation; bipolar transistors; insulated gate bipolar transistors; mixture models; parameter estimation; transient analysis; BJT model; HVIGBT transient mixture model; Kirk effect; MOSFET; PSIM software; carrier transport equations; empirical values; high voltage IGBT; parameter extraction method; Capacitance; Insulated gate bipolar transistors; Integrated circuit modeling; Mathematical model; Semiconductor device modeling; Testing; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transportation Electrification Asia-Pacific (ITEC Asia-Pacific), 2014 IEEE Conference and Expo
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-4240-4
Type :
conf
DOI :
10.1109/ITEC-AP.2014.6940694
Filename :
6940694
Link To Document :
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