DocumentCode :
1364628
Title :
Developing a low-cost high-quality software tool for dynamic fault-tree analysis
Author :
Dugan, Joanne Bechta ; Sullivan, Kevin J. ; Coppit, David
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
Volume :
49
Issue :
1
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
49
Lastpage :
59
Abstract :
Sophisticated modeling and analysis methods are being developed in academic and industrial research labs for reliability engineering and other domains. The evaluation and evolution of such methods based on use in practice is critical to research progress, but few such methods see widespread use. A critical impediment to disseminating new methods is the inability to produce, at a reasonable cost, supporting software tools that have the: usability and dependability characteristics that industrial users require; and evolvability to accommodate software change as the underlying analysis methods are refined and enhanced. The difficulty of software development thus emerges as a key impediment to advances in engineering modeling and analysis. This paper presents an approach to tool development that attacks these problems. Progress requires synergistic, interdisciplinary collaborations between application-domain and software-engineering researchers. The authors have pursued such an approach in developing Galileo: a fault tree modeling and analysis tool. These innovations are described in two dimensions: (1) the Galileo core reliability modeling and analysis function; and (2) the authors´ work on software engineering for high-quality, low-cost modeling and analysis tools
Keywords :
fault trees; software reliability; software tools; Galileo; dependability; dynamic fault-tree analysis; high-quality software tool; reliability analysis; reliability engineering; reliability modeling; software development; usability; Collaborative software; Collaborative work; Computer industry; Costs; Impedance; Programming; Refining; Reliability engineering; Software tools; Usability;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.855536
Filename :
855536
Link To Document :
بازگشت