DocumentCode :
1364673
Title :
Reliability evaluation of combined k-out-of-n:F, consecutive-k-out-of-n:F and linear connected-(r, s)-out-of-(m, n):F system structures
Author :
Zuo, Ming J. ; Lin, Daming ; Wu, Yanhong
Author_Institution :
Dept. of Mech. Eng., Alberta Univ., Edmonton, Alta., Canada
Volume :
49
Issue :
1
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
99
Lastpage :
104
Abstract :
Based on a real industrial application, three new system reliability models are proposed: combined k-out-of-n:F and consecutive-k c-out-of-n:F system; combined k-out-of-m·n:F and linear connected-(r,s)-out-of-(m,n):F system; and combined k-out-of-m·n:F consecutive-kc-out-of-n:F and linear connected-(r,s)-out-of-(m,n):F system. Reliability evaluation algorithms are provided for these models. The computation times of the algorithms for these models are, respectively: O(n·k), O(k·n·2 m·sm-r+2), O(k·n·(2kc )sm-r+1). The algorithms are used for system reliability evaluation of furnace systems. The concept of the combined k-out-of-n:F and 1-dimensional and 2-dimensional consecutive-k-out-of-n:F systems can be extended to other variations of the consecutive-k-out-of-n:F systems, e.g., the consecutive-k-out-of-n:G system and 1-dimensional and 2-dimensional r-within-k-out-of-n:F systems. The concept of Markov chain imbeddable (MIS) systems is another excellent tool that can be used for analysis of such combined system structures
Keywords :
Markov processes; consecutive system reliability; failure analysis; Markov chain imbeddable systems; combined k-out-of-n:F system structures; combined system structures; computation times; consecutive-k-out-of-n:F structures; consecutive-kc,-out-of-n:F system structures; linear connected-(r, s)-out-of-(m, n):F system structures; reliability evaluation algorithms; Costs; Councils; Creep; Employee welfare; Furnaces; Hydrogen; Mathematics; Mechanical engineering; Reliability; Temperature;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.855542
Filename :
855542
Link To Document :
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