Title :
Onset of Material Alterations Due to Laser-Induced Plasma Exposure in Nanofilms Deposited on Photomasks
Author :
Varghese, Ivin ; Zhou, Dong ; Peri, M.D.Murthy ; Cetinkaya, Cetin
Author_Institution :
Dept. of Mech. & Aeronaut. Eng., Clarkson Univ., Potsdam, NY, USA
Abstract :
Damage-free removal of sub-100 nm particles from photomasks with deposited nanofilms is a challenge in lithography. Laser-induced plasma (LIP) is an emerging noncontact, chemical-free, dry, and selective nanoparticle removal technique. Investigation of the onset of material alterations on bonded nanofilms for optimizing LIP particle removal process is the objective of this paper. Shockwave thermomechanical excitation and radiation heating from the plasma core are major potential sources of damage. Computational analyses reported here indicate radiation heating as the chief damage source. Damage thresholds for the critical nanofilm surface temperature rise and radial stress component have been identified for a given nanosecond pulsed laser.
Keywords :
laser beam effects; lithography; masks; LIP particle removal process; laser-induced plasma exposure; lithography; material alterations; nanofilms; photomasks; selective nanoparticle removal technique; shockwave thermomechanical excitation; Cleaning of thin films; damage threshold; material alteration; nanofilm; nanoparticle removal; photomasks; radiation intensity from LIP; shockwave;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2009.2024872