• DocumentCode
    1365130
  • Title

    A 62 mV 0.13 \\mu m CMOS Standard-Cell-Based Design Technique Using Schmitt-Trigger Logic

  • Author

    Lotze, Niklas ; Manoli, Yiannos

  • Author_Institution
    Dept. of Microsyst. Eng., Univ. of Freiburg, Freiburg, Germany
  • Volume
    47
  • Issue
    1
  • fYear
    2012
  • Firstpage
    47
  • Lastpage
    60
  • Abstract
    Supply voltage reduction beyond the minimum energy per operation point is advantageous for supply voltage constrained applications, but is limited by the degradation of on-to-off current ratios with decreasing supply. In this work, we show that the effective on-to-off ratio can be considerably improved by the use of Schmitt Trigger structures, which effectively reduce the leakage from the gate output node and thereby stabilize the output level. A method for applying this concept to general logic is presented. Design rules concerning transistor sizing, gate selection and layout necessary to further minimize the required supply voltage are outlined and applied to the design of a chip implementing 8 × 8 bit multipliers as test structures. The only custom design step is the creation of the Schmitt Trigger standard-cell library, otherwise a regular digital tool chain is used. The multipliers exhibit full functionality down to supply voltages of 84 mV-62 mV, depending on the area overhead invested. No process or post-silicon tuning like body biasing is used. At the minimum possible supply voltage of 62 mV, a power consumption of 17.9 nW at an operation frequency of 5.2 kHz is measured for an 8 × 8 bit multiplier.
  • Keywords
    CMOS logic circuits; integrated circuit design; logic design; multiplying circuits; CMOS standard-cell-based design technique; Schmitt trigger standard-cell library; Schmitt-trigger logic; body biasing; frequency 5.2 kHz; gate selection; multipliers; post-silicon tuning; power 17.9 nW; size 0.13 mum; supply voltage reduction; test structures; transistor sizing; voltage 84 mV to 62 mV; CMOS integrated circuits; Hysteresis; Inverters; Logic gates; MOS devices; Minimization; Transistors; Sub-threshold; low power; process variations; schmitt trigger; ultra-low voltage logic;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2011.2167777
  • Filename
    6064922