Title :
Electromagnetic Susceptibility Analysis on a Digital Pulse Width Modulator for SMPSs
Author :
Orietti, Enrico ; Saggini, Stefano ; Mattavelli, Paolo ; Spiazzi, Giorgio
Author_Institution :
Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
Abstract :
In this paper, a digital pulse width modulator (DPWM) is analyzed from the point of view of susceptibility to radio-frequency interference (RFI). The chosen DPWM architecture is based on the hybrid delay-line/counter scheme commonly used in the digital control of switched-mode power supplies (SMPSs). This paper focuses on the DPWM performance degradation in the presence of electromagnetic interference (EMI), and for this purpose a DPWM with time resolution down to 350 ps has been designed and manufactured in a standard 0.35- mum complementary metal-oxide semiconductor technology. Measurements and analytical analyses are presented for both EMI effects on the internal generated clock signal and on the PWM duty-cycle precision. The immunity degradation mechanisms are investigated by means of an analytical approach, demonstrating that the PWM susceptibility is more strictly related to its functional design rather than to the implemented topology. The effects of clock and duty-cycle jitter induced by RFIs are finally verified using a simulation model on a digitally controlled buck converter, highlighting the importance of such issue on steady-state performances of SMPSs.
Keywords :
CMOS integrated circuits; jitter; pulse width modulation; radiofrequency interference; switched mode power supplies; SMPS; complementary metal-oxide semiconductor technology; counter scheme; digital pulse width modulator; duty-cycle jitter; electromagnetic interference; electromagnetic susceptibility analysis; hybrid delay-line; radio-frequency interference; switched-mode power supplies; Degradation; Digital control; Digital modulation; EMP radiation effects; Electromagnetic analysis; Electromagnetic interference; Pulse width modulation; Pulsed power supplies; Radiofrequency interference; Space vector pulse width modulation; CMOS oscillators; Complementary metal–oxide semiconductor (CMOS) analog integrated circuits; electromagnetic interference (EMI); integrated circuits (ICs), modeling; oscillator stability; pulse width modulation (PWM); timing jitter;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2009.2028328