Author_Institution :
WesTest Eng., Farmington, UT, USA
Abstract :
How to identify when a static pattern digital test program should be re-hosted as a dynamic pattern set on the state-of-the-art ATE is complicated. However, there are critical issues that should be evaluated when making this decision. Issues include chip models, timing parameters, drive strength, logic levels, circuit complexity, I/O pins, automated diagnostics, portability, reuse, speed, optimal circuit coverage, schematics, and data availability.
Keywords :
automatic test equipment; circuit complexity; driver circuits; logic circuits; timing circuits; ATE; I/O pins; automated diagnostics; chip models; circuit complexity; drive strength; dynamic pattern set; logic levels; re host candidates; static pattern digital test program; timing parameters; Aerospace testing; Digital systems; Test facilities;
