DocumentCode :
1366119
Title :
Density-induced modifications of the IR emission spectrum of Xe2 excimers in dense gas
Author :
Borghesani, A.F. ; Carugno, G.
Author_Institution :
Dept. of Phys., Univ. of Padua, Padua, Italy
Volume :
16
Issue :
6
fYear :
2009
fDate :
12/1/2009 12:00:00 AM
Firstpage :
1543
Lastpage :
1551
Abstract :
The infrared emission spectrum of Xe2 excimers produced by irradiating Xe gas with high-energy electrons has been monitored as a function of density up to 3.3 MPa at room temperature. Excimer decay yields a broad continuum centered around 7800 cm-1 of width 900 cm-1 at 0.1 MPa. The spectrum shape is consistent with a bound-free molecular transition between 0u + and 0g + states correlated with 6p and 6s atomic limits. Upon increasing density, the spectrum is strongly red-shifted and broadened. The present measurements confirm preliminary results obtained in a smaller density range. The shift is explained by the dielectric screening exerted by the gas atoms on the optically active electron-ionic molecular core interaction, and by quantum multiple scattering effects of the electron scattered off the gas atoms. The latter effect links this experiment to electron transport experiments in non-polar gases. The different spectrum broadening in pure Xe and in an Ar-Xe mixture is believed to be due to quantum indistinguishability of identical particles.
Keywords :
argon; excimers; infrared spectra; luminescence; molecule-electron collisions; red shift; spectral line broadening; xenon; Ar-Xe; IR emission spectrum density induced modifications; Xe2; argon-xenon mixture; bound-free molecular transition; broadened spectrum; dielectric screening; electron irradiated xenon gas; identical particle quantum indistinguishability; optically active electron-ionic molecular core interaction; pressure 0.1 MPa; quantum multiple scattering effects; red shifted spectrum; spectrum shape; wave number 7800 cm-1; xenon excimer IR emission spectrum; Atom optics; Atomic measurements; Electron emission; Infrared spectra; Infrared surveillance; Monitoring; Optical scattering; Particle scattering; Shape; Temperature; Xe2 excimers, infrared luminescence, density effects, red-shift, broadening, dielectric screening, multiple scattering, atom-diatom collisions;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2009.5361573
Filename :
5361573
Link To Document :
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