DocumentCode
1366317
Title
CMOS charge-transfer preamplifier for offset-fluctuation cancellation in low-power A/D converters
Author
Kotani, Koji ; Shibata, Tadashi ; Ohmi, Tadahiro
Author_Institution
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
Volume
33
Issue
5
fYear
1998
fDate
5/1/1998 12:00:00 AM
Firstpage
762
Lastpage
769
Abstract
We have developed a low-power, high-accuracy comparator composed of a dynamic latch and a CMOS charge transfer preamplifier (CT preamplifier). The CT preamplifier amplifies the input signal with no static power dissipation, and the operation is almost insensitive to the device parameter fluctuations. The low-power and high-accuracy comparator has been realized by combining the CT preamplifier with a dynamic latch circuit. The fluctuation in the offset voltage of a dynamic latch is reduced by a factor of the preamplifier gain. A 4-bit flash A/D converter circuit has been designed and fabricated by 0.6-μm CMOS process. Low differential nonlinearity of less than ±4 mV has been verified by the measurements on test circuits, showing 8-bit resolution capability. Very low power operation at 4.3 μW per MS/s per comparator has also been achieved
Keywords
CMOS analogue integrated circuits; analogue-digital conversion; comparators (circuits); preamplifiers; 0.6 micron; 4 bit; 4.3 muW; CMOS charge-transfer preamplifier; device parameter fluctuations; differential nonlinearity; dynamic latch circuit; flash A/D converter circuit; high-accuracy comparator; low-power A/D converters; offset voltage; offset-fluctuation cancellation; resolution capability; CMOS process; CMOS technology; Charge transfer; Circuit testing; Fluctuations; Histograms; Latches; Power dissipation; Preamplifiers; Threshold voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.668991
Filename
668991
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