Title :
Measurement of Epitaxial NbN/AlN/NbN Tunnel Junctions With a Low Critical Current Density at Low Temperature
Author :
Qiu, W. ; Terai, H. ; Wang, Z.
Author_Institution :
Kobe Adv. ICT Res. Center, Nat. Inst. of Inf. & Commun. Technol., Kobe, Japan
fDate :
6/1/2011 12:00:00 AM
Abstract :
Superconducting qubit circuits require high quality low critical current density Josephson tunnel junctions. We have developed high quality epitaxial NbN/AlN/NbN tunnel junctions with critical current density, Jc, ranging from as low as a few A/cm2 to a few tens of kA/cm2. In this work, we measured current-voltage characteristics for junctions with a Jc ~ 32 A/cm2 in the temperature range from 17 mK to above 6.7 K. All the junctions are in good quality and have a high gap voltage (>; 5.5 mV). We found that the junctions´ sub-gap resistances were temperature dependent above 2.5 K and saturated at temperatures below 2.5 K. A junction sub-gap leakage current Ir of about 23 pA was measured. The voltage noise power spectral density for 3 junctions with different sizes has been measured at the base temperature of 17 mK with the junctions biased above the gap voltage. The spectral densities clearly show 1/f behavior at low frequency and are proportional to the junction´s linear dimension.
Keywords :
1/f noise; Josephson effect; aluminium compounds; leakage currents; niobium compounds; quantum computing; superconducting epitaxial layers; superconducting junction devices; NbN-AlN-NbN; current-voltage characteristics; gap voltage; high quality epitaxial NbN-AlN-NbN tunnel junctions; high quality low critical current density Josephson tunnel junctions; junction linear dimension; junction subgap leakage current; junction subgap resistances; superconducting qubit circuits; temperature 17 mK; voltage noise power spectral density; Book reviews; Current measurement; Josephson junctions; Junctions; Leakage current; Noise; Temperature measurement; $1/f$ noise; Decoherence; Josephson junction; epitaxial; quantum computing;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2081653