• DocumentCode
    1367091
  • Title

    Constraining object features using a polarization reflectance model

  • Author

    Wolff, Lawrence B. ; Boult, Terrance E.

  • Author_Institution
    Columbia Univ., New York, NY, USA
  • Volume
    13
  • Issue
    7
  • fYear
    1991
  • fDate
    7/1/1991 12:00:00 AM
  • Firstpage
    635
  • Lastpage
    657
  • Abstract
    The authors present a polarization reflectance model that uses the Fresnel reflection coefficients. This reflectance model accurately predicts the magnitudes of polarization components of reflected light, and all the polarization-based methods presented follow from this model. The authors demonstrate the capability of polarization-based methods to segment material surfaces according to varying levels of relative electrical conductivity, in particular distinguishing dielectrics, which are nonconducting, and metals, which are highly conductive. Polarization-based methods can provide cues for distinguishing different intensity-edge types arising from intrinsic light-dark or color variations, intensity edges caused by specularities, and intensity edges caused by occluding contours where the viewing direction becomes nearly orthogonal to surface normals. Analysis of reflected polarization components is also shown to enable the separation of diffuse and specular components of reflection, unobscuring intrinsic surface detail saturated by specular glare. Polarization-based methods used for constraining surface normals are discussed
  • Keywords
    light polarisation; light reflection; optical information processing; pattern recognition; reflectivity; Fresnel reflection coefficients; color variations; electrical conductivity; intensity edges; intrinsic light-dark variations; machine vision; pattern recognition; polarization reflectance model; surface segmentation; Cameras; Computer vision; Dielectric materials; Fresnel reflection; Inspection; Machine vision; Optical polarization; Optical reflection; Predictive models; Reflectivity;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.85655
  • Filename
    85655