DocumentCode :
1367115
Title :
Ultra-Low Vibration Pulse-Tube Cryocooler Stabilized Cryogenic Sapphire Oscillator With {\\hbox {10}}^{-16} Fractional Frequency Stability
Author :
Hartnett, John G. ; Nand, Nitin R.
Author_Institution :
Sch. of Phys., Univ. of Western Australia, Crawley, WA, Australia
Volume :
58
Issue :
12
fYear :
2010
Firstpage :
3580
Lastpage :
3586
Abstract :
A low maintenance long-term operational cryogenic sapphire oscillator has been implemented at 11.2 GHz using an ultra-low-vibration cryostat and pulse-tube cryocooler. It is currently the world´s most stable microwave oscillator employing a cryocooler. Its performance is explained in terms of temperature and frequency stability. The phase noise and the Allan deviation of frequency fluctuations have been evaluated by comparing it to an ultra-stable liquid-helium cooled cryogenic sapphire oscillator in the same laboratory. Assuming both contribute equally, the Allan deviation evaluated for the cryocooled oscillator is σy ≈ 1 × 10-15τ-1/2 for integration times 1 <; τ <; 10 s with a minimum σy = 3.9 × 10-16 at τ = 20 s. The long term frequency drift is less than 5×10-14/day. From the measured power spectral density of phase fluctuations, the single-sideband phase noise can be represented by Lφ(f) = 10-14.0/f4+10-11.6/f3+10-10.0/f2+10-10.2/f+ 10-11.0 rad2/Hz for Fourier frequencies 10-3 <; f <; 103 Hz in the single oscillator. As a result, Lφ ≈ -97.5 dBc/Hz at 1-Hz offset from the carrier.
Keywords :
cryogenic electronics; frequency stability; microwave oscillators; sapphire; vibrations; Allan deviation; Fourier frequencies; frequency fluctuations; frequency stability; long term frequency drift; low maintenance long-term operational cryogenic sapphire oscillator; microwave oscillator; phase fluctuations; power spectral density; pulse-tube cryocooler stabilized oscillator; single-sideband phase noise; temperature stability; ultra-low vibration cryogenic sapphire oscillator; ultra-low-vibration cryostat; ultra-stable liquid-helium cooled cryogenic sapphire oscillator; Cryogenics; Helium; Phase noise; Temperature sensors; Thermal stability; Cryocooler; cryogenic sapphire oscillator; frequency stability; phase noise;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2010.2086551
Filename :
5617322
Link To Document :
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