• DocumentCode
    1367394
  • Title

    Automated inspection of textile fabrics using textural models

  • Author

    Cohen, Femand S. ; Fan, Zhigang ; Attali, Stephane

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
  • Volume
    13
  • Issue
    8
  • fYear
    1991
  • fDate
    8/1/1991 12:00:00 AM
  • Firstpage
    803
  • Lastpage
    808
  • Abstract
    The authors discuss the problem of textile fabric inspection using the visual textural properties of the fabric. The problem is to detect and locate the various kinds of defects that might be present in a given fabric sample based on an image of the fabric. Stochastic models are used to model the visual fabric texture. The authors use the Gaussian Markov random field to model the texture image of nondefective fabric. The inspection problem is cast as a statistical hypothesis testing problem on statistics derived from the model. The image of the fabric patch to be inspected is partitioned into nonoverlapping windows of size N×N where each window is classified as defective or nondefective based on a likelihood ratio test of size α. The test is recast in terms of the sufficient statistics associated with the model parameters. The sufficient statistics are easily computable for any sample. The authors generalize the test when the model parameters of the fabric are assumed to be unknown
  • Keywords
    Markov processes; inspection; pattern recognition; statistical analysis; textile industry; Gaussian Markov random field; likelihood ratio test; nondefective fabric; statistical hypothesis testing; textile fabric inspection; textural models; visual textural properties; Fabrics; Inspection; Markov random fields; Maximum likelihood detection; Maximum likelihood estimation; Printed circuits; Statistical analysis; Stochastic processes; Testing; Textiles;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.85670
  • Filename
    85670