DocumentCode :
1367439
Title :
Effects of mechanical alignment errors on Compton scatter imaging
Author :
Du, Y.F. ; He, Z. ; Knoll, G.F. ; Wehe, D.K.
Author_Institution :
Dept. of Nucl. Eng., Michigan Univ., Ann Arbor, MI, USA
Volume :
47
Issue :
3
fYear :
2000
fDate :
6/1/2000 12:00:00 AM
Firstpage :
885
Lastpage :
889
Abstract :
The development of a prototype Compton scattering camera based on two 1 cm3 cubic 3-D position sensitive CZT detectors is underway in our laboratory. As a practical problem, the mechanical alignment error may be larger than the 1 mm detector position resolution. This paper investigates the effects of any possible mechanical alignment error on the reconstructed images by Monte Carlo simulations. Our simulation results show that a minor misalignment can cause a significant distortion in the reconstructed image. Any alignment error will lead to a systematic error if the mechanical misalignment is not compensated for. Since the alignment error can cause a distinguishable distortion, system parameters can be adjusted during the image reconstruction procedure until an optimal image is obtained. In this manner, the mechanical alignment error can be automatically determined and compensated for. Our results indicate that any distortion due to alignment error can be eliminated and ensure the angular resolution remains only limited by the two detectors energy and position resolutions
Keywords :
Compton effect; Monte Carlo methods; cadmium compounds; gamma-ray apparatus; gamma-ray detection; position sensitive particle detectors; semiconductor counters; CdZnTe; Compton scatter imaging; Compton scattering camera; Monte Carlo simulations; angular resolution; cubic 3D position sensitive CZT detectors; image reconstruction procedure; mechanical alignment errors; Anodes; Cameras; Electromagnetic scattering; Energy resolution; Image reconstruction; Laboratories; Particle scattering; Prototypes; Radiation detectors; Solid scintillation detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.856712
Filename :
856712
Link To Document :
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