Title :
Cellular automata-based test pattern generators with phase shifters
Author :
Mrugalski, Grzegorz ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Inst. of Electron. & Telecommun., Poznan Univ. of Technol., Poznan, Poland
fDate :
8/1/2000 12:00:00 AM
Abstract :
The paper presents a novel, comprehensive and systematic methodology, which can be used to automate synthesis of cellular automata-based test pattern generators with phase shifters. First, a very fast and simple simulation framework is proposed to either verify or generate maximum-length linear finite state machines such as cellular automata or linear feedback shift registers. Subsequently, a new framework is presented for efficient selection of phase shifters that satisfy criteria of channel separation and circuit complexity. As shown in the paper, it is possible to synthesize, in a time-efficient manner, very large cellular automata and their corresponding fast phase shifters for built-in self-test applications with guaranteed structural and functional properties
Keywords :
automatic test pattern generation; built-in self test; cellular automata; finite state machines; integrated circuit testing; logic testing; phase shifters; shift registers; built-in self-test applications; cellular automata-based test pattern generators; channel separation; circuit complexity; functional properties; linear feedback shift registers; maximum-length linear finite state machines; phase shifters; simulation framework; structural properties; Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Linear feedback shift registers; Phase shifters; System testing; Test pattern generators;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
