• DocumentCode
    1367702
  • Title

    The combinatorial design approach to automatic test generation

  • Author

    Cohen, David M. ; Dalal, Siddhartha R. ; Parelius, Jesse ; Patton, Gardner C.

  • Author_Institution
    Bellcore, NJ, USA
  • Volume
    13
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    83
  • Lastpage
    88
  • Abstract
    The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability
  • Keywords
    automatic testing; program debugging; program testing; software cost estimation; systems analysis; automatic test generation; code coverage; combinatorial design approach; fault detection ability; program testing costs; test plan development; Automatic testing; Code standards; Costs; Design methodology; Fault detection; Medical tests; Reliability engineering; Software testing; System testing; User interfaces;
  • fLanguage
    English
  • Journal_Title
    Software, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7459
  • Type

    jour

  • DOI
    10.1109/52.536462
  • Filename
    536462
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1367702