DocumentCode :
1367754
Title :
A 0.5-to-2.5 Gb/s Reference-Less Half-Rate Digital CDR With Unlimited Frequency Acquisition Range and Improved Input Duty-Cycle Error Tolerance
Author :
Inti, Rajesh ; Yin, Wenjing ; Elshazly, Amr ; Sasidhar, Naga ; Hanumolu, Pavan Kumar
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Volume :
46
Issue :
12
fYear :
2011
Firstpage :
3150
Lastpage :
3162
Abstract :
A reference-less highly digital half-rate clock and data recovery (CDR) circuit with improved tolerance to input duty cycle error is presented. Using a chain of frequency dividers, the pro posed frequency detector produces a known sub-harmonic tone from the incoming random data. A digital frequency-locked loop uses the extracted tone, and drives the oscillator to any sub-rate of the input data frequency. The early/late outputs of a conventional half-rate bang-bang phase detector are used to determine the duty-cycle error in the incoming random data and adjust the oscillator clock phases to maximize receiver timing margins. Fabricated in 0.13 μm CMOS technology, the prototype digital CDR op erates without any errors from 0.5 Gb/s to 2.5 Gb/s. At 2 Gb/s, the prototype consumes 6.1 mW power from a 1.2 V supply. The pro posed clock-phase calibration is capable of correcting upto ±20% of input data duty-cycle error.
Keywords :
CMOS integrated circuits; calibration; clock and data recovery circuits; frequency dividers; frequency locked loops; phase detectors; CMOS technology; bit rate 0.5 Gbit/s to 2.5 Gbit/s; clock-phase calibration; digital frequency-locked loop; digital half-rate clock and data recovery; frequency acquisition range; frequency detector; frequency dividers; half-rate bang-bang phase detector; input duty-cycle error tolerance; oscillator clock phases; power 6.1 mW; receiver timing margins; size 0.13 mum; sub-harmonic tone; voltage 1.2 V; Calibration; Detectors; Frequency conversion; Frequency locked loops; Phase locked loops; Radiation detectors; Spectral density; Digital CDR; clock phase calibration; data duty cycle error; linear delay cell; optimal sampling; power spectral density of random NRZ data; reference-less frequency acquisition;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2011.2168872
Filename :
6069580
Link To Document :
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